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Dr.-Ing. Shyam Praveen Vudathu

Ehemaliger Mitarbeiter der Scientific Computing in Engineering


Publikationen (Auswahl)vollständige Liste

  1. S. P. Vudathu.
    Optimization of Yield and Reliability using Enhanced Worst-Case Methods.
    Dissertationsschrift, Universität Bremen, Shaker Verlag, 2016.
  2. S. P. Vudathu, A. Bunse-Gerstner, D. Kubalinska, K. Kumar Duganapalli, R. Laur.
    Yield analysis via induction of process statistics into the design of MEMS and other microsystems.
    Microsystem Technologies, 13(11), 1545–1551, 2007.
  3. S. P. Vudathu, A. Bunse-Gerstner, D. Kubalinska, K. Kumar Duganapalli, R. Laur.
    Parametric Yield Analysis of MEMS via Statistical Methods.
    DTIP 2006 - Design, Test, Integration and Packaging of MEMS / MOEMS, 26.04.-28.04.2006, Stresa, Lago Maggiore, Italien.

    online unter: http://hdl.handle.net/2042/6491