Dr.-Ing. Shyam Praveen Vudathu

Publications (Selection)complete list

1. S. P. Vudathu.
   Optimization of Yield and Reliability using Enhanced Worst-Case Methods.
   Dissertationsschrift, Universität Bremen, Shaker Verlag, 2016.
2. S. P. Vudathu, A. Bunse-Gerstner, D. Kubalinska, K. Kumar Duganapalli, R. Laur.
   Yield analysis via induction of process statistics into the design of MEMS and other microsystems.
   Microsystem Technologies, 13(11), 1545–1551, 2007.
3. S. P. Vudathu, A. Bunse-Gerstner, D. Kubalinska, K. Kumar Duganapalli, R. Laur.
   Parametric Yield Analysis of MEMS via Statistical Methods.
   DTIP 2006 - Design, Test, Integration and Packaging of MEMS / MOEMS, 26.04.-28.04.2006, , Italy.
   

   online at: http://hdl.handle.net/2042/6491