Dr.-Ing. Shyam Praveen Vudathu
Ehemaliger Mitarbeiter der Scientific Computing in EngineeringPublikationen (Auswahl)
- S. P. Vudathu.
Optimization of Yield and Reliability using Enhanced Worst-Case Methods.
Dissertationsschrift, Universität Bremen, Shaker Verlag, 2016. - S. P. Vudathu, A. Bunse-Gerstner, D. Kubalinska, K. Kumar Duganapalli, R. Laur.
Yield analysis via induction of process statistics into the design of MEMS and other microsystems.
Microsystem Technologies, 13(11), 1545–1551, 2007. - S. P. Vudathu, A. Bunse-Gerstner, D. Kubalinska, K. Kumar Duganapalli, R. Laur.
Parametric Yield Analysis of MEMS via Statistical Methods.
DTIP 2006 - Design, Test, Integration and Packaging of MEMS / MOEMS, 26.04.-28.04.2006, Stresa, Lago Maggiore, Italien.
online unter: http://hdl.handle.net/2042/6491