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% Shyam Praveen Vudathu







@ARTICLE{Vudathu2007_bc458,
  author = {Shyam Praveen Vudathu and Angelika Bunse-Gerstner and Dorota Kubalinska and Kishore Kumar Duganapalli and Rainer Laur},
  title = {Yield analysis via induction of process statistics into the design of MEMS and other microsystems},
  journal = {Microsystem Technologies},
  volume = {13},
  number = {11},
  pages = {1545–1551},
  year = {2007}
}


@PHDTHESIS{Vudathu2016_26600,
  author = {Shyam Praveen Vudathu},
  title = {Optimization of Yield and Reliability using Enhanced Worst-Case Methods},
  school = {Universität Bremen},
  publisher = {Shaker Verlag},
  year = {2016}
}


@CONFERENCE{Vudathu2006_40ff9,
  author = {Shyam Praveen Vudathu and Angelika Bunse-Gerstner and Dorota Kubalinska and Kishore Kumar Duganapalli and Rainer Laur},
  title = {Parametric Yield Analysis of MEMS via Statistical Methods},
  booktitle = {DTIP 2006 - Design, Test, Integration and Packaging of MEMS / MOEMS, 26.04.-28.04.2006, Stresa, Lago Maggiore, Italien},
  year = {2006}
}