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Einladung zum Vortrag


29. Juni 2016, 15.00 Uhr s.t.
Universität Bremen | MZH | 8090

Dr. Matthias Sauer
AlbertLudwigsUniversität Freiburg

Application of Formal Methods to the Test of Digital Circuits

Miniaturized electronic devices have changed the habits of people worldwide and led to the development of a
connected world with data access everywhere and every time. Such innovations would not be possible without
the increased capabilities of current production processes. During the last years, the community has managed
to keep the famous Moore's law still in place and succeeded in cutting power consumption while at the same
time reducing the size and cost of each transistor. However, these improvements in the production processes
also lead to increased challenges connected to the testing of these devices and hence to assess the reliability of
such devices in e.g., safetycritical environments.
Current testing processes have reached a point, where classical pass/fail testing methods were replaced by
grading based techniques, assessing the quality of a test set not only by its primary testing capability but in
addition with regards to secondary objectives e.g., meeting timing constraints or managing the power
consumption. Hence, testing of digital circuits evolved from the straightforward problem to generate a test for
a given fault to a multiconstraint optimization problem. As a consequence, the complexity of test generation
procedures greatly increased requiring novel and innovative reasoning techniques.
Within this talk, such new techniques based on formal methods such as the Boolean satisfiability problem (SAT)
and its extensions with a special emphasis of MaxSATbased optimization will be presented and their
application for several important aspects within the test digital circuits will be discussed.
Biografie
Dr. Matthias Sauer is a postdoctoral researcher within the Computer Architecture Group at the University of
Freiburg. He studied computer science in Freiburg and received his PhD from the same university in 2013. His
research interests include computeraided design, test pattern generation for digital circuits and hardware
security, with a special focus on the application of formal methods within these fields.


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Microsoft Word - Sauer.docx Microsoft Word - Sauer.docx jungmann PScript5.dll Version 5.2.2 Acrobat Distiller 10.1.16 (Windows) Fri Jun 24 10:31:25 2016 Fri Jun 24 10:31:25 2016 no 1 no 595.22 x 842 pts (A4) 119559 bytes yes 1.5
Application of Formal Methods to the Test of Digital Circuits
Application of Formal Methods to the Test of Digital Circuits


 



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