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Einladung zum Vortrag
26. November 2013, 10 Uhr c.t.
(ACHTUNG | SONDERTERMIN AUSSER DER REIHE! GEÄNDERTE UHRZEIT!)
Universität Bremen | MZH 8090
Indranil Sen Gupta
Indian Institute of Technology Kharagpur, India
Diagnosis:
Coping with imperfect Design and Manufacturing Defects
Fault diagnosis plays a very important role in enhancing the yield of the VLSI manufacturing process. A number of
researchers have proposed various techniques for fault diagnosis over the years, but a number of practical problems
still remain. In particular, the problem of multiple fault diagnosis and characterization of test sets from the point of
view of diagnosis did not receive much attention. The first part of the talk will discuss a framework to analyze
multiple faults, and diagnose the same. Based on multiple fault simulation in a particle swarm optimization
environment, experimentation on benchmarks reveal that up to ten faults can be diagnosed within a reasonable
amount of time. The second part of the talk will discuss a new metric to characterize test sets based on their
diagnostic power. The metric can also be utilized to increase the diagnosability of incompletely specified test sets
using don't care filling. The don't care filling approach can be integrated with test pattern generation tools to aid in
better diagnostic pattern set generation.
Biografie
Prof. Indranil Sen Gupta has obtained his B.Tech., M.Tech. and Ph.D. degrees in Computer Science and
Engineering from the University of Calcutta, India in the years 1983, 1985 and 1990, respectively. Currently, he
is a full professor in the Department of Computer Science and Engineering at the Indian Institute of Technology
as well as the Managing Director of the Science and Technology Entrepreneur's Park (STEP) in Kharagpur, India.
He has over 25 years of teaching and research experience, guided 13 PhD students (with 8 more ongoing), and
has more than 130 publications to his credit in international journals and conferences. His research interests
include VLSI design and testing, cryptography and network security, as well as reversible computing.
Dieser Gast wurde von Rolf Drechsler eingeladen.
Prof. Dr. Rolf Drechsler 218-63932

Diagnosis: Coping with imperfect Design and Manufacturing Defects
Diagnosis: Coping with imperfect Design and Manufacturing Defects


 



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